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Best Practices for Effective Test - 3 PDH Credits

  • 22-Oct-2014
  • 8:30 AM - 11:30 AM
  • High Tech Rochester, Lennox Tech Enterprise Center, 150 Lucius Gordon Drive, Suite 100, West Henrietta

Wednesday, October 22

Institute of Electrical and Electronic Engineers (IEEE) 

Best Practices for Effective Test

3 PDH Credits

Speaker: James Campbell, President, Viewpoint Systems, Inc.

Location: High Tech Rochester, Lennox Tech Enterprise Center, 150 Lucius Gordon Drive, Suite 100, West Henrietta

Time: 8:30 to 11:30 am

Cost: No charge.

Reservations: Details on the website at http://rochester.ieee.org


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